Imaging & Characterization

Probe Stations

Two probe stations are hosted by the Pratt Microfabrication Facility, including one probe station generously donated by Everbeing Int’l Corp.

Keithley SMU 2400 Graphical Series Sourcemeter

The SMU 2400 Sourcemeter is hosted in the Pratt Microfabrication Facility, and was generously donated by Tektronix, Inc.

HP 4155A Semiconductor Parameter Analyzer

The 4155A Semiconductor Parameter Analyzer is hosted by the Pratt Microfabrication Facility.

Nikon 3D Microscope

The Nikon 3D Microscope is hosted by the Pratt Microfabrication Facility.

 

Optical Microscopes

Each of the three TNFC facilities provide access to optical microscopes for visual analysis of devices and samples.

Horiba Joben Yvon UVISEL Ellipsometer

The UVISEL Ellipsometer is hosted by the Bahen Prototyping Facility.

Dektak Profilometer

The probe station is hosted by the Bahen Prototyping Facility.