Imaging & Characterization

Equipment Available

Probe Stations

Everbeing ProbestationTwo probe stations are hosted by the Pratt Microfabrication Facility, including one probe station generously donated by Everbeing Int’l Corp.

 

Keithley SMU 2400 Graphical Series Sourcemeter

SourcemeterThe SMU 2400 Sourcemeter is hosted in the Pratt Microfabrication Facility, and was generously donated by Tektronix, Inc.

 

HP 4155A Semiconductor Parameter Analyzer

Pratt-Semiconductor-Parameter-AnalyzerThe 4155A Semiconductor Parameter Analyzer is hosted by the Pratt Microfabrication Facility.

 

Nikon 3D Microscope

Pratt-3D-MicroscopeThe Nikon 3D Microscope is hosted by the Pratt Microfabrication Facility.

 

Nanometrics NanoSpec/AFT 4000 Reflectometer

Pratt-NanoSpecThe NanoSpec/AFT 4000 Reflectometer is hosted by the Pratt Microfabrication Facility.

 

Optical Microscopes

Bahen-MicroscopeEach of the three TNFC facilities provide access to optical microscopes for visual analysis of devices and samples.

 

Horiba Joben Yvon UVISEL Ellipsometer

Bahen-EllipsometerThe UVISEL Ellipsometer is hosted by the Bahen Prototyping Facility.

 

Dektak Profilometer

Bahen-ProfilometerThe probe station is hosted by the Bahen Prototyping Facility.